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TEST PATTERN GENERATION USING BOOLEAN PROOF ENGINES IBD

GöRSCHWIN FEY / ROLF DRECHSLER / STEPHAN EGG
SPRINGER
10 / 2010
9789048184910
Inglés

Sinopsis

1 Introduction. 2 Preliminaries. 2.1 Circuits. 2.2 Fault Models. 2.3 Simple ATPG Framework. 2.4 Classical ATPG Algorithms. 2.5 Benchmarking. 3 Boolean Satisfiability. 3.1 SAT Solver. 3.2 Advances in SAT.3.3 Circuit-to-CNF Conversion. 3.4 Circuit-oriented SAT. 4 SAT-based ATPG. 4.1 Basic Problem Transformation. 4.2 Structural Information. 4.3 Experimental Results. 4.4 Summary. 5 Learning Techniques. 5.1 Introductory Example. 5.2 Concepts for Reusing Learned Information. 5.3 Heuristics for ATPG. 5.4 Experimental Results. 5.5 Summary. 6 Multiple-valued Logic. 6.1 Four-Valued Logic. 6.2 Multi-input Gates. 6.3 Experimental Results. 6.4 Summary. 7 Improved Circuit-to-CNF Conversion. 7.1 Hybrid Logic. 7.2 Incremental Instance Generation. 7.3 Experimental Results. 7.4 Summary. 8 Branching Strategies. 8.1 Standard Heuristics of SAT Solvers. 8.2 Decision Strategies. 8.3 Experimental Results. 8.4 Summary. 9 Integration into Industrial Flow. 9.1 Industrial Environment. 9.2 Integration of SAT-based ATPG. 9.3 Test Pattern Compactness. 9.4 Experimental Results. 9.5 Summary. 10 Delay Faults. 10.1 Transition Delay. 10.2 Path Delay. 10.3 Encoding Efficiency for Path Delay Faults. 10.4 Incremental Approach. 10.5 Experimental Results. 10.6 Summary. 11 Summary and Outlook. Bibliography. Index.